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Special Measurements

DDR3 Measurement Bundle

Revision 1.0, December, 2009
By: ASA
Free

Description

This Measurement Bundle contains a total of 49 Measurement Apps, enabling measurement of all special parameters required by the DDR3 Compliance App. Some of the included Apps are combination Apps which measure multiple statistics directly for the Compliance App. Other included Apps provide Compliance Breakout capability for the combination Apps.

If you are looking for the full DDR3 Compliance App (which includes this Bundle), ASA recommends that you specifically download that through the Compliance App link below.

Specifications/Details

Spec Level:      DDR3 - JESD79-3C

App Update Level/Date:      1.0, December 2009

Minimum M1 version required:      v6.03

Measurements Made:

  • Multiple; see list below

Statistics Produced:

  • Multiple; see list below

Assumptions:

  • Unless otherwise specified by the specific Measurement App, all require Strobe as 1st signal, Clock as 2nd signal, and Data as 3rd signal

Compliance Breakout™ sub-Apps included with this App:     

  • Combined tDQSH/tDQSL/tDQSS
  • Combined tDQSCK/tDSS/tDSH
  • Combined tDQSH/tDQSL
  • Combined tIS/tIH/tVAC for CK/DQS
  • Combined tDQSQ/tQH/tDIPW
  • Combined tIS/tIH/tVAC for DQ/DQS
  • Combined tRPRE/tWPRE/tPST
  • Overshoot area for Cmd/Addr/DQ
  • Undershoot area for Cmd/Addr/DQ
  • Overshoot area for CK/DQS
  • Undershoot area for CK/DQS
  • tSRQse min/max only
  • tDH - Data hold time from DQS/DQS# referenced to Vih(dc)/Vil(dc) levels
  • tDIPW - DQ and DM input pulse width for each input
  • tDQSCK - DQS rising edge output access time from rising CK
  • tDQSH - DQS/DQS# differential input HIGH pulse width
  • tDQSL - DQS/DQS# differential input LOW pulse width
  • tDQSQ - DQS-DQ skew per group per access
  • tDQSS - DQS/DQS# rising edge to CK/CK# rising edge
  • tDS - Data setup time to DQS/DQS# referenced to Vih(ac)/Vil(ac) levels
  • tDSH - DQS/DQS# falling edge hold time from CK/CK# rising edge
  • tDSS - DQS/DQS# falling edge setup time to CK/CK# rising edge
  • tHZ(DQ) - DQ high impedance time from CK/CK#
  • tHZ(DQS) - DQS and DQS# high-impedance time (referenced from RL + BL/2)
  • tIH - Command and address hold time from CK/CK# referenced to Vih(dc)/Vil(dc) levels
  • tIS - Command and address setup time to Cl/CK# referenced to Vih(ac)/Vil(ac) levels
  • tLZ/tHZ for DQ
  • tLZ/tHZ for DQS
  • tLZ(DQ) - DQ low-impedance time from CK/CK#
  • tLZ(DQS) - DQS/DQS# low-impedance time (referenced from RL-1)
  • tWPST or tRPST - DQS/DQS# differential READ or WRITE postamble
  • tQH - DQ output hold time from DQS/DQS#
  • tQSH - DQS/DQS# differential output high time
  • tQSL - DQS/DQS# differential output low time
  • tRPRE - DQS/DQS# differential READ preamble
  • tSRQse - Single-ended output slew rate
  • tVAC - Required time above Vih(ac)/below Vil(ac) for valid transition
  • tWPRE - DQS/DQS# differential WRITE preamble
  • tERR(n) for n=7-8-9-10
  • tERR(n) for n=11-12-13-14
  • tERR(n) for n=15-16-17-18
  • tERR(n) for n=19-20-21-22
  • tERR(n) for n=23-24-25-26
  • tERR(n) for n=27-28-29-30
  • tERR(n) for n=31-32-33-34
  • tERR(n) for n=35-36-37-38
  • tERR(n) for n=39-40-41-42
  • tERR(n) for n=43-44-45-46
  • tERR(n) for n=47-48-49-50

This Special Measurement Bundle is part of:     

Features

  • Not Applicable for this App

Comments

Some of the Measurement Apps included in this bundle combine multiple parameters together, and have separate Apps that measure each of those parameters individually as well. The primary purpose of a combined Measurement App is for use in a Compliance App, where it allows the test to proceed as quickly as possible by minimizing the recalculation that would be required for measuring similar parameters in different Apps. The individual Measurement Apps, on the other hand, are primarily intended for use in a Debug scenario, where having all of the statistics and data for a particular parameter is required.

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